The introduction of several new dielectric materials for high-speed ultra-large-scale integration (ULSI) microelectronics has increased the necessity for metrology tools to measure the ...

Thin films are two-dimensional (2D) material layers deposited on a bulk substrate, possessing a thickness of a few nanometers to impart properties that cannot be realized by base materials. The unique ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Filmetrics® F20 benchtop thin-film ...

In previous studies of thin film wrinkling on soft substrates, the mechanics models usually assume plane-strain deformation, which was found to disagree with experimental observations for narrow thin ...